AIML Special Presentation: Dr Kateryna Dugina

Dr Kateryna Dugina from the University of Nottingham spoke about leveraging X-Ray microCT and Image Segmentation techniques to explore grain internal structure.

This seminar details the process and methodology of X-Ray micro-CT scanning for the non-invasive investigation of wheat grain's internal structure. A comparative analysis of various image segmentation techniques will be presented, discussing their respective advantages and challenges. Our focus was on identifying the most effective method for segmenting endosperm, germ, aleurone layer and outer pericarp, with comparisons made across distinct wheat landraces.