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CT scanning wheat grains for stress tolerance
![Jessica Schmidt and Delphine Fleury](/newsroom/sites/default/files/styles/ua_landscape/public/media/images/2020-02/Jessica%20Schmidt%20and%20Delphine%20Fleury_SMALL.jpg?h=e068fafc&itok=uaKP_LV6)
Scientists have developed a computed tomography (CT) scanning method for screening large samples of wheat for drought and heat tolerance.
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